Center for Relativistic Laser Science

ABC 2018

Abstract: We present an adaptive optical label-free reflection microscopy that is based on the aberration correction algorithm using closed-loop accumulation of single scattering [Nature Comm. 8, 2157 (2017)], but its imaging configuration relies on the point illumination and the wide-field detection, which can make a full use of a spatial distinction between single- and multiple-scattering components of reflected wave from the sample. By improving the ratio of the single- and the multiple-scattering components, we can not only image objects hidden in depth of up to 10 times the scattering mean free path with a diffraction-limited resolution of 500 nm but also successfully eliminate the sample-induced aberrations even in the strong multiple scattering regime.