Aberration correction for laser scanning microscopy by ‘closed-loop accumulation of single scattering (CLASS)’ algorithm
2018 GRC
‘Collective accumulation of single scattering (CASS)’ and ‘Closed-loop accumulation of single scattering (CLASS)’ microscopy was introduced recently. These methods provide novel solutions to the problems of light scattering and aberration in optical imaging, and they provided increased imaging depth while maintaining diffraction limited resolution. Until now these methods demonstrated monochromatic contrast by utilizing back scattered illumination light.
Here, I introduce a novel imaging method to correct aberration for the laser scanning microscopy by adopting CLASS algorithm. This method can be applied to any type of laser scanning microscopy, and it is expected that aberration correction will enhance the imaging depth and resolution while it is still providing full spectral information of regular confocal/multiphoton microscopy. The strength and weakness of the introduced method over the current adaptive optical microscopy will be discussed. As an application example, mouse eye image acquired by this method will be presented.