Center for Relativistic Laser Science

ICAMD 2017

Single particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, POlarization-SElective Interferometric Detection for Optical scattering Nanoscopy (POSEIDON), that enables us to capture rotational as well as positional information of nano-size objects using polarization of light. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the azimuthal orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle in the nanoscopic world